Interplay between hole instability and nanoparticle array formation in ultrathin liquid films

Langmuir

Volumn 14, Issue 12, 1998, Pages 3418-3424

  Ohara, Pamela C ^a,b   Gelbart, William M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EVAPORATION; INTERPOLATION; LIQUID METALS; MONOLAYERS; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; PASSIVATION; SOLVENTS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS;

LIQUID FILMS;

METALLIC FILMS;

EID: 0032499583     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la971147f     Document Type: Article

References (30)

1. Herron, N.; Calabrese, J. C.; Farneth, W. E.; Wang, T. Science 1993, 259, 1426; Vossmeyer, T.; Reck, G.; Katsikas, L.; Haupt, E. T. K.; Schulz, B.; Weller, H. Science 1995, 267, 1476; Eychmuller, A.; Mews, A.; Weller, H. Chem. Phys. Lett. 1993, 208, 59; Murray, C. B.; Kagan, C. R.; Bawendi, M. G. Science 1995, 270, 1335.
2. Herron, N.; Calabrese, J. C.; Farneth, W. E.; Wang, T. Science 1993, 259, 1426; Vossmeyer, T.; Reck, G.; Katsikas, L.; Haupt, E. T. K.; Schulz, B.; Weller, H. Science 1995, 267, 1476; Eychmuller, A.; Mews, A.; Weller, H. Chem. Phys. Lett. 1993, 208, 59; Murray, C. B.; Kagan, C. R.; Bawendi, M. G. Science 1995, 270, 1335.
3. Herron, N.; Calabrese, J. C.; Farneth, W. E.; Wang, T. Science 1993, 259, 1426; Vossmeyer, T.; Reck, G.; Katsikas, L.; Haupt, E. T. K.; Schulz, B.; Weller, H. Science 1995, 267, 1476; Eychmuller, A.; Mews, A.; Weller, H. Chem. Phys. Lett. 1993, 208, 59; Murray, C. B.; Kagan, C. R.; Bawendi, M. G. Science 1995, 270, 1335.
4. Herron, N.; Calabrese, J. C.; Farneth, W. E.; Wang, T. Science 1993, 259, 1426; Vossmeyer, T.; Reck, G.; Katsikas, L.; Haupt, E. T. K.; Schulz, B.; Weller, H. Science 1995, 267, 1476; Eychmuller, A.; Mews, A.; Weller, H. Chem. Phys. Lett. 1993, 208, 59; Murray, C. B.; Kagan, C. R.; Bawendi, M. G. Science 1995, 270, 1335.
5. Takagahara, T. Surf. Sci. 1992, 267, 310; Kagan, C. R.; Murray, C. B.; Nirmal, M.; Bawendi, M. G. Phys. Rev. Lett. 1996, 76, 1517.
6. Takagahara, T. Surf. Sci. 1992, 267, 310; Kagan, C. R.; Murray, C. B.; Nirmal, M.; Bawendi, M. G. Phys. Rev. Lett. 1996, 76, 1517.
7. Ohara, P. C.; Heath, J. R.; Gelbart, W. M. Angew. Chem., Int. Ed. 1997, 36, 1077.
8. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389, 827.
9. Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183.
10. See, for example, Brochard-Wyart, F.; di Meglio, J. M.; Quere, D.; de Gennes, P. G. Langmuir 1991, 7, 335; de Gennes, P. G. Rev. Mod. Phys. 1985, 57, 827.
11. See, for example, Brochard-Wyart, F.; di Meglio, J. M.; Quere, D.; de Gennes, P. G. Langmuir 1991, 7, 335; de Gennes, P. G. Rev. Mod. Phys. 1985, 57, 827.
12. Elbaum, M.; Lipson, S. G. Phys. Rev. Lett. 1994, 72, 3562.
13. Brochard-Wyart, F.; Daillant, J. Can. J. Phys. 1990, 58, 1084.
14. BT) is the Hamaker constant appropriate to gold or silver metal (m) interacting through alkanses with the carbon substrate (s). r (2-3 nm) is the radius of the metal particle "core" and δ (1-2 nm) is the thickness of its adsorbed alkylthiol monolayer.
15. DiBenedetti, P. Metastable Liquids; Princeton University Press: Princeton, NJ, 1996.
16. Schenning, A. P. H. J.; Benneker, F. B. G.; Geurts, H. P. M.; Lin, X. Y.; Nolte, R J. M. J. Am. Chem. Soc. 1996, 118, 8549.
17. Kralchevsky, P. A.; Ivanov, I. B.; Nagayama, K. J. Colloid Interface Sci. 1992, 151, 79 and references therein.
18. Luedtke, W. D.; Landman, U. J. Phys. Chem. 1996, 100, 13323.
19. See for example, Ball, R. C. et al., Phys. Rev. Lett. 1987, 58, 275, and Weitz, D.; Oliveria, M. Phys. Rev. Lett. 1984, 52, 1433.
20. See for example, Ball, R. C. et al., Phys. Rev. Lett. 1987, 58, 275, and Weitz, D.; Oliveria, M. Phys. Rev. Lett. 1984, 52, 1433.
21. See, for example, Hunter, R. J. Foundations of Colloid Science, Volume 1; Oxford University Press: New York, 1987.
22. See, for example, Krim, J. Langmuir 1996, 12, 4564 and references therein.
23. See, for example, Safran, S. A. Statistical Thermodynamics of Surfaces, Interfaces, and Membranes; Addison-Wesley: New York, 1994.
24. Joanny J. F.; Robbins, M. O. J. Chem. Phys. 1990, 92, 3206.
25. See, for example, Fichthorn, K. A.; Weinberg, W. H. J. Chem. Phys. 1991, 95, 1090 and references contained therein.
26. Reiss, H. J. Chem. Phys. 1951, 19, 482.
27. Using the Langmuir equation for the net evaporation rate from a volatile bulk liquid film (see discussion, say, in Xia, T. K.; Landman, U. J. Chem. Phys. 1994, 101, 2498) leads to an estimate of about 1 ns for the time required for a R = 1 nm hole to open. However, one must be careful about using bulk viscosities and evaporation rates from films as thin as those in our system.
28. 3, where γ is the fluid viscosity. Equating this to the ratio of the hole size R divided by the time γ for filling this hole, and taking γ = 0.1 poise and t = R = 1 nm, we find τ on the order of a nanosecond, and hence comparable to the evaporation time estimated in ref 19.
29. 7 for example, conclude that evaporation rates in their thin films are up to 100 times smaller than the corresponding bulk values.
30. Ohara, P. C.; Leff, D. V.; Health, J. R.; Gelbert, W. M. Phys. Rev. Lett. 1995, 75, 3486.