A new force controlled atomic force microscope for use in ultrahigh vacuum

Review of Scientific Instruments

Volumn 67, Issue 6, 1996, Pages 2281-2285

  Jarvis, S P ^a   Yamada, H ^a   Yamamoto, S I ^a   Tokumoto, H ^a  

^a JRCAT   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000343966     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147047     Document Type: Article

References (22)

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