Avalanche injection of hot holes in the gate oxide of LDMOS transistors

Solid-State Electronics

Volumn 44, Issue 7, 2000, Pages 1325-1330

  Manzini, S ^a   Gallerano, A ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; DEGRADATION; HOT CARRIERS; OXIDES; THRESHOLD VOLTAGE;

AVALANCHE GENERATED HOT HOLES;

MOSFET DEVICES;

EID: 0033732867     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00317-2     Document Type: Article

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