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Volumn 27, Issue 2, 2000, Pages 159-175

Advances in the Spherical Harmonic-Boltzmann-Wigner approach to device simulation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; FUNCTIONS; HARMONIC ANALYSIS; INTERPOLATION; MOSFET DEVICES; QUANTUM THEORY;

EID: 0033732864     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1999.0810     Document Type: Article
Times cited : (23)

References (15)
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    • Goldsman, N.1    Henrickson, L.2    Frey, J.3
  • 2
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    • A generalized Legendre polynomial/sparse matrix approach for determining the distribution function in non-polar semiconductors
    • Hennacy K. A., Goldsman N. A generalized Legendre polynomial/sparse matrix approach for determining the distribution function in non-polar semiconductors. Solid-State Electron. 36:1993;869-877.
    • (1993) Solid-State Electron. , vol.36 , pp. 869-877
    • Hennacy, K.A.1    Goldsman, N.2
  • 3
    • 0029359452 scopus 로고
    • Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation
    • Hennacy K. A., Wu Y.-J., Goldsman N., Mayergoyz I. D. Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation. Solid-State Electron. 38:1995;1498-1495.
    • (1995) Solid-State Electron. , vol.38 , pp. 1498-1495
    • Hennacy, K.A.1    Wu, Y.-J.2    Goldsman, N.3    Mayergoyz, I.D.4
  • 4
    • 0031079523 scopus 로고    scopus 로고
    • 2-dMOSFET modeling including surface effects and impact ionization by self-consistent solution of the Boltzmann, Poisson and hole-continuity equations
    • Liang W., Goldsman N., Mayergoyz I., Oldiges P. 2-dMOSFET modeling including surface effects and impact ionization by self-consistent solution of the Boltzmann, Poisson and hole-continuity equations. IEEE Trans. Electron Devices. 44:1997;257-276.
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 257-276
    • Liang, W.1    Goldsman, N.2    Mayergoyz, I.3    Oldiges, P.4
  • 5
    • 0027697831 scopus 로고
    • Modeling impact ionization in a BJT by means of spherical harmonics expansion of the Boltzmann transport equation
    • Gnudi A., Ventura D., Baccarani G. Modeling impact ionization in a BJT by means of spherical harmonics expansion of the Boltzmann transport equation. IEEE Trans. CAD. 12:1993;1706.
    • (1993) IEEE Trans. CAD , vol.12 , pp. 1706
    • Gnudi, A.1    Ventura, D.2    Baccarani, G.3
  • 6
    • 0027576244 scopus 로고
    • Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation
    • Gnudi A., Ventura D., Baccarani G., Odeh F. Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation. Solid-State Electron. 36:1993;575.
    • (1993) Solid-State Electron. , vol.36 , pp. 575
    • Gnudi, A.1    Ventura, D.2    Baccarani, G.3    Odeh, F.4
  • 7
    • 0031123286 scopus 로고    scopus 로고
    • An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation
    • Vecchi M. C., Mohring J., Rudan M. An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation. IEEE Trans. CAD ICAS. 16:1997;353.
    • (1997) IEEE Trans. CAD ICAS , vol.16 , pp. 353
    • Vecchi, M.C.1    Mohring, J.2    Rudan, M.3
  • 8
    • 0031647347 scopus 로고    scopus 로고
    • Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE
    • Vecchi M. C., Rudan M. Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE. IEEE Trans. Electron Devices. 45:1998;230.
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 230
    • Vecchi, M.C.1    Rudan, M.2
  • 9
    • 0342696276 scopus 로고    scopus 로고
    • A transient solution of the Boltzmann equation exposes energy overshoot in semiconductor devices
    • Lin C.-K., Goldsman N., Mayergoyz I. D., Chang C.-H. A transient solution of the Boltzmann equation exposes energy overshoot in semiconductor devices. J. Appl. Phys. 86:1999;468-475.
    • (1999) J. Appl. Phys. , vol.86 , pp. 468-475
    • Lin, C.-K.1    Goldsman, N.2    Mayergoyz, I.D.3    Chang, C.-H.4
  • 10
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    • Spherical harmonic modeling of a 0.05 μm base BJT: A comparison with Monte Carlo and asymptotic analysis
    • Chang C.-H., Lin C.-K., Goldsman N., Mayergoyz I. D. Spherical harmonic modeling of a 0.05 μm base BJT: a comparison with Monte Carlo and asymptotic analysis. VLSI Design. 8:1998;147-151.
    • (1998) VLSI Design , vol.8 , pp. 147-151
    • Chang, C.-H.1    Lin, C.-K.2    Goldsman, N.3    Mayergoyz, I.D.4
  • 12
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    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 619-627
    • Fiegna, C.1    Sangiorgi, E.2
  • 13
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    • A many-band silicon model for hot-electron transport at high energies
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    • Brunetti, R.1    Jacoboni, C.2
  • 14
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    • Deterministic modeling of impact ionization with a random-kapproximation and the solution of the multi-band Boltzmann transport equation
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.