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A physics-based analytical/numerical solution to the Boltzmann transport equation for use in device simulation
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A generalized Legendre polynomial/sparse matrix approach for determining the distribution function in non-polar semiconductors
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Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation
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0031079523
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2-dMOSFET modeling including surface effects and impact ionization by self-consistent solution of the Boltzmann, Poisson and hole-continuity equations
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Liang W., Goldsman N., Mayergoyz I., Oldiges P. 2-dMOSFET modeling including surface effects and impact ionization by self-consistent solution of the Boltzmann, Poisson and hole-continuity equations. IEEE Trans. Electron Devices. 44:1997;257-276.
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0027697831
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Modeling impact ionization in a BJT by means of spherical harmonics expansion of the Boltzmann transport equation
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Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation
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An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation
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Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE
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Vecchi M. C., Rudan M. Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE. IEEE Trans. Electron Devices. 45:1998;230.
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0342696276
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A transient solution of the Boltzmann equation exposes energy overshoot in semiconductor devices
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Lin C.-K., Goldsman N., Mayergoyz I. D., Chang C.-H. A transient solution of the Boltzmann equation exposes energy overshoot in semiconductor devices. J. Appl. Phys. 86:1999;468-475.
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Spherical harmonic modeling of a 0.05 μm base BJT: A comparison with Monte Carlo and asymptotic analysis
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Chang C.-H., Lin C.-K., Goldsman N., Mayergoyz I. D. Spherical harmonic modeling of a 0.05 μm base BJT: a comparison with Monte Carlo and asymptotic analysis. VLSI Design. 8:1998;147-151.
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Chang, C.-H.1
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Modeling of high-energy electrons in MOS devices at the microscopic level
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A many-band silicon model for hot-electron transport at high energies
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Deterministic modeling of impact ionization with a random-kapproximation and the solution of the multi-band Boltzmann transport equation
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