Extraction of emitter and base series resistances of bipolar transistors from a single DC measurement

IEEE Transactions on Semiconductor Manufacturing

Volumn 13, Issue 2, 2000, Pages 119-126

  Linder, Martin ^a   Ingvarson, Fredrik ^b,c   Jeppson, Kjell O ^b,c   Grahn, Jan V ^a,c   Zhang, Shi Li ^a   Östling, Mikael ^a,c  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c IEEE

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE STRUCTURES;

BASE SERIES RESISTANCES; EMITTER; PARAMETER EXTRACTION; TEST STRUCTURE;

BIPOLAR TRANSISTORS;

EID: 0033688063     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.843626     Document Type: Article

References (22)

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