New procedure for extraction of series resistances for bipolar transistors from DC measurements

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 147-151

  Linder, M ^a   Ingvarson, F ^a   Jeppson, K O ^a   Grahn, J V ^a   Zhang, S L ^a   Ostling, M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE MEASUREMENT; SEMICONDUCTOR DEVICE MODELS;

DIRECT CURRENT EXTRACTION METHODS; GUMMEL-POON MODEL;

BIPOLAR TRANSISTORS;

EID: 0032627232     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (18)