Inclusion of substrate effects in the flyback method for BJT resistance characterization

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 194-199

  MacSweeney, Dermot ^a   McCarthy, Kevin ^a   Mathewson, Alan ^a   Power, J A ^a   Kelly, S C ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC RESISTANCE; SUBSTRATES;

FLYBACK METHOD; NING-TANG METHOD;

BIPOLAR TRANSISTORS;

EID: 0032680862     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)