Mapping the subsurface composition of organic films by electric force microscopy

Langmuir

Volumn 16, Issue 12, 2000, Pages 5231-5233

  Takano, Hajime ^a   Wong, Sze Shun ^a   Harnisch, Jennifer A ^a   Porter, Marc D ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; GOLD; MOLECULAR STRUCTURE; MONOLAYERS; PHOTOMAPPING; PLASTIC FILMS; SEMICONDUCTOR DOPING;

ELECTRIC FORCE MICROSCOPY; MICROCONTACT PRINTING; ORGANIC FILMS; POLYMERIC FILM; SUBSURFACE COMPOSITION;

LANGMUIR BLODGETT FILMS;

EID: 0033686558     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0002334     Document Type: Article

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24. The effect of the polymer coating on contrast is also revealed through a comparison of lift heights that have similar values for Δ(Δφ) for the two types of samples, e .g., 100-nm lift height for the polystyrene-coated sample and 300-nm lift height for the sample without polystyrene. Since the attractive force is proportional to the derivative of the capacitance between tip and sample and the capacitance is proportional to the dielectric constant of the intervening material, the attractive force is larger for the polystyrene-coated sample than for the uncoated sample when the separation distance between tip and underlying gold substrate is the same. We suspect that differences in the structural orientation of the polystyrene film at the monolayer-coating and coating-air interface may have an effect on the magnitude of the attractive force, but experiments to determine the extent of such a contribution have yet to be performed.
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26. The lateral resolution was estimated from thehorizontal distance clearly separating the two domains in the images collected by scanning over smaller sized area to increase pixel density.