Investigation of photoinduced tunneling current and local surface photovoltage by STM

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 187-191

  Matthes, Th W ^a   Sommerhalter, Ch ^b   Rettenberger, A ^a   Bohmisch M ^a   Boneberg, J ^a   Lux Steiner, M Ch ^b   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Scanning tunneling spectroscopy; Surface photovoltage; WS 2

Indexed keywords

CHARGE CARRIERS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SURFACE MEASUREMENT; TUNGSTEN COMPOUNDS; VAN DER WAALS FORCES;

PHOTOINDUCED TUNNELING CURRENTS; SURFACE PHOTOVOLTAGE; Z FEEDBACK TECHNIQUE;

SEMICONDUCTOR MATERIALS;

EID: 18844475414     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00480-7     Document Type: Article

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