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Volumn 419, Issue 2-3, 1999, Pages 120-127
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The (2 x 4) and (2 x 1) structures of the clean GaP(001) surface
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Author keywords
Gallium phosphide; Low index single crystal surfaces; Photoelectron diffraction; Scanning tunneling microscopy; Semiconductor surfaces; Synchrotron radiation photoelectron spectroscopy
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Indexed keywords
ANNEALING;
AUGER ELECTRON SPECTROSCOPY;
IONS;
LOW ENERGY ELECTRON DIFFRACTION;
PHOTOELECTRON SPECTROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SINGLE CRYSTALS;
SPUTTERING;
SYNCHROTRON RADIATION;
GALLIUM PHOSPHIDE;
LOW INDEX SINGLE CRYSTAL SURFACE;
X RAY PHOTOELECTRON DIFFRACTION;
SURFACE STRUCTURE;
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EID: 0033521421
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(98)00769-9 Document Type: Article |
Times cited : (23)
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References (18)
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