Measurement of forces during the modification of C60 islands

Surface Science

Volumn 437, Issue 1, 1999, Pages 99-106

  Lantz, M A ^a   O'Shea, S J ^a   Welland, M E ^a  

^a Engineering Department   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; ELECTRIC CONDUCTIVITY; FULLERENES; MOLECULES; PLATINUM METALS; PRESSURE EFFECTS; SCANNING TUNNELING MICROSCOPY; STIFFNESS; STRENGTH OF MATERIALS; SUPERCONDUCTING FILMS; SURFACE STRUCTURE;

ATOMIC SCALE IMAGING; CONDUCTING TIP; ELECTRICAL TRANSPORT; SURFACE DEFECTS;

SURFACE TREATMENT;

EID: 0033366149     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00698-6     Document Type: Article

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