Direct observation of fullerene-adsorbed tips by scanning tunneling microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 593-596

  Kelly, K F ^a   Sarkar, Dipankar ^a   Prato, Stefano ^a   Resh, J S ^a   Hale, G D ^a   Halas, N J ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ARGON; CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; FULLERENES; GRAPHITE; IMAGING TECHNIQUES; ION BOMBARDMENT; MOLECULES; NANOSTRUCTURED MATERIALS; SURFACES;

FULLERENE ADSORBED TIPS; INVERSE IMAGING;

SCANNING TUNNELING MICROSCOPY;

EID: 0030107201     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589141     Document Type: Article

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