Amorphization of C60 fullerite by applying pressure in the GPa range using a scanning tunneling microscope: Observation of transitions and aging

Journal of Physics and Chemistry of Solids

Volumn 58, Issue 11, 1997, Pages 1757-1761

  Lang, H P ^a   Thommen Geiser, V ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Collapsed fullerite; Fullerenes; Scanning tunneling microscopy

Indexed keywords

AMORPHIZATION; CALCULATIONS; HIGH PRESSURE EFFECTS; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

CARBON RINGS; FULLERITE;

FULLERENES;

EID: 0031275633     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(97)00062-0     Document Type: Article

References (23)

1. Wilson, R. J., Meijer, G., Bethune, D. S., Johnson, R. D., Chambliss, D. D., de Vries, M. S., Hunziker, H. E. and Wendt, H. R., Nature, 1990, 348, 621.
2. Wragg, J. L., Chamberlain, J. E., White, H. W., Krätschmer, W. and Huffman, D. R., Nature, 1990, 348, 623.
3. Lang, H. P., Heeger, K. M., Thommen-Geiser, V. and Güntherodt, H.-J., Phil. Mag., 1994, B70, 721.
4. Núñez-Regueiro, M., Marques, L., Hodeau, J.-L., Béthoux, O. and Perroux, M., Phys. Rev. Lett., 1995, 74, 278.
5. Rao, A. M., Zhou, P., Wang, K.-A., Hager, G. T., Holden, J. M., Wang, Y., Lee, W.-T., Bi, X. X., Eklund, P. C., Comett, D. S., Duncan, M. A. and Amster, I. J., Science, 1993, 2349, 955.
6. Oszlanyi, G., Allan, D. R., Cernik, R. J., Bushnell-Wye, G., Geigel, G., Pekker, S. and Tegze, M., Solid State Commun., 1992, 84, 1081.
7. Blank, V. D., Buga, S. G., Popov, M. Yu., Davydov, V. A., Agafonov, V., Céolin, R., Szwarc, H., Rassat, A. and Fabre, C., New J. Chem., 1995, 19, 253.
8. Haines, J. and Léger, J. M., Solid State Commun., 1994, 90, 361.
9. Snoke, D. W., Raptis, Y. S. and Syassen, K., Phys. Rev., 1992, B45, 14419.
10. Moshary, F., Chen, N. H., Silvera, I. F., Brown, C. A., Dorn, H. C., de Vries, M. S. and Bethune, D. S., Phys. Rev. Lett., 1992, 69, 466.
11. Yoo, C. S. and Nellis, W. J., Chem. Phys. Lett., 1992, 198, 379.
12. Snoke, D. W., Syassen, K. and Mittelbach, A., Phys. Rev., 1993, B47, 4146.
13. Kosowsky, S. D., Hsu, C.-H., Chen, N. H., Moshary, F., Pershan, P. S. and Silvera, I. F., Phys. Rev., 1993, B48, 8474.
14. Nú̈nez-Regueiro, M., Monceau, P. and Hodeau, J.-L., Nature, 1992, 355, 237.
15. Lang, H. P., Wiesendanger, R., Thommen-Geiser, V., Hofer, R. and Güntherodt, H.-J., J. Vac. Sci. Technol., 1994, B12, 2136.
16. Lang, H. P., Thommen-Geiser, V. and Güntherodt, H.-J., Synth. Metals, 1996, 77, 161.
17. Mamin, H. J., Ganz, E., Abraham, D. W., Thomson, R. E. and Clarke, J., Phys. Rev., 1986, B34, 9015.
18. Mate, C. M., Erlandsson, R., McClelland, G. M. and Chiang, S., Surf. Sci., 1989, 208, 473.
19. Lang, H. P., Thommen-Geiser, V., Bolm, C., Felder, M., Frommer, J., Wiesendanger, R., Schlögl, R., Zahab, A., Bernier, P., Gerth, G., Anselmetti, D. and Güntherodt, H.-J., Appl. Phys., 1993, A56, 197.
20. Chen, T., Howells, S., Gallagher, M., Yi, L., Sarid, D., Lichtenberger, D. L., Nebesny, K. W. and Ray, C. D., J. Vac. Sci. Technol., 1991, B9, 2461.
21. Gaisch, R., Berndt, R., Schneider, W. D., Gimzewski, J. K., Reihl, B., Schlittler, R. R. and Tschudy, M., J. Vac. Sci. Technol., 1994, B12, 2153.
22. Behler, S., Lang, H. P., Pan, S., Thommen-Geiser, V. and Güntherodt, H.-J., Z. Phys., 1993, B91, 1.
23. Chavy, C., Hoachim, C. and Altibelli, A., Chem. Phys. Lett., 1993, 214, 569.