Simplified evaluation method for light-biased effective lifetime measurements

Applied Physics Letters

Volumn 71, Issue 13, 1997, Pages 1795-1797

  Schuurmans, F M ^a   Schonecker A ^a   Burgers, A R ^a   Sinke, W C ^a  

^a TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000986733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119401     Document Type: Article

References (20)

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