Friction coefficients derived from apparent height variations in contact mode atomic force microscopy images

Langmuir

Volumn 15, Issue 22, 1999, Pages 7662-7669

  Li, Junwei ^a   Wang, Chen ^a   Shang, Guangyi ^a   Xu, Qingmin ^a   Lin, Zhang ^a   Guan, Jingjiao ^a   Bai, Chunli ^a  

^a INSTITUTE OF CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; LIQUID CRYSTALS; MICA;

CONTACT MODE ATOMIC FORCE MICROSCOPY; FRICTION COEFFICIENTS; FRICTION FORCE MICROSCOPY (FFM); SELF-ASSEMBLED MONOLAYERS (SAM);

MONOLAYERS;

EID: 0033349128     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981750d     Document Type: Article

References (41)

1. Johnson, K. L. Langmuir 1996, 12, 4510-4513.
2. Schwarz, U. D.; Allers, W.; Gensterblum, G.; Wiesendanger, R. Phys. Rev. B 1995, 52, 14976-14984.
3. Erlandsson, R.; Hadziioannou, G.; Mate, C. M.; McClelland, G. M.; Chiang, S. J. Chem. Phys. 1988, 89, 5190-5193.
4. Liu, Y.; Evans, D. F. Langmuir 1996, 12, 1235-1244.
5. Yoshizawa, H.; Chen, Y.; Israelachvili, J. J. Phys. Chem. 1993, 97, 4128-4140.
6. Bhushan, A.; Israelachvili, J. N.; Landman, U. Nature 1995, 374, 607-616.
7. Matsuzawa, N. N.; Kishii, N. J. Phys. Chem. 1993, 97, 4128-4140.
8. Buldum, A.; Ciraci, S. Phys. Rev. B 1997, 55, 2606-2611.
9. Binnig, G. F.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930-933.
10. Bai, C. Scanning Tunneling Microscopy and Its Application; Springer-Verlag: Heidelberg, 1995.
11. Binnig, G. F.; Gerber, C.; Stoll, E.; Albrecht, T. R.; Quate, C. F. Europhy. Lett. 1987, 3, 1281-1286.
12. Carpick, R. M.; Salmeron, M. Chem. Rev. 1997, 97, 1163-1194.
13. Briscoe, B. J.; Evans, D. C. B. Proc. R. Soc. London A 1982, 380, 389-407.
14. Persson, B. N. Phys. Rev. B 1997, 55, 8004-8012.
15. Radmacher, M.; Tillmann, R. W.; Frtz, M.; Gaub, H. E. Science 1992, 257, 1900-1905 and references therein.
16. Overney, R.; Meyer, E.; Frommmer, J.; Brodbeck, D.; Lüthi, R.; Howald, L.; Güntherodt, H. J.; Fujihira, M.; Takano, H.; Gotoh, Y. Nature 1992, 359, 133-135.
17. Fisbie, C. D.; Rozsnyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. M. Science 1994, 265, 2701-2704.
18. McKendry, R.; Theoclitou, M.; Rayment, T.; Abell, C. Nature 1998, 391, 566-568.
19. Green, J. D.; McDermott, M. T.; Porter, M. D. J. Phys. Chem. 1995, 99, 10960-0965.
20. Tsukruk, V. V.; Bliznyuk, V. N. Langmuir 1998, 4, 446-455.
21. Noy, A.; Frisbie, C. D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943-7951.
22. Neumeister, J. M.; Ducker, W. A. Rev. Sci. Instrum. 1994, 65, 2527-2531.
23. Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K Rev. Sci. Instrum. 1993, 64, 403-405.
24. Ogletree, D. F.; Carpick, R. W.; Salmeron, M. Rev. Sci. Instrum. 1996, 67, 3298-3306.
25. Stupp, S. I.; Son, S.; Lin, H. C.; Li, L. S. Science 1993, 259, 59-63.
26. Poiruer, G. E.; Pylant, E. D. Science 1996, 272, 1145-1147.
27. Naselli, C.; Swalen, J. D.; Rabolt, J. F. J. Chem. Phys. 1989, 90, 3855-3860.
28. Meyer, E.; Overney, R.; Lüthi, R.; Brodbeck, D.; Howald, L.; Frommer, J. ; Günther, H. J.; Wolter, O.; Fujihira, M.; Takano, H.; Gotoh, Y. Thin Solid Films 1992, 220, 130-137.
29. Dierker, S. B.; Pindak, R.; Meyer, R. B. Phys. Rev. Lett. 1987, 56, 1819-1822.
30. Shang, G.; Qiu, X.; Wang, C.; Bai, C. Appl. Phys. A 1998, 66, 333-335.
31. Bearing analysis calculates and displays the surface height histograms for the selected area. We took the separation between the two peaks of two Gaussian distributions (the height distributions of mica and the monolayer domain respectively) as the apparent height of monolayers. The deviation of the data was estimated by the half-height width, which is typically 10%.
32. Bhushan, B. Micro/nanotribology and its Applications; Kluwer Academic Publishers: Dordrecht, 1997; 233-238.
33. Mach, P.; Huang, C. C.; Nguyen, H. T.Phys. Rev. Lett. 1998, 80, 732-735.
34. Chaudhury, M. K.; Whitesides, G. M. Science 1992, 255, 1230-1232.
35. Feldman, K.; Tervoort, T.; Smith, P.; Spencer, N. D. Langmuir 1996, 14, 372-378.
36. Ruan, J.; Bhushan, B. J. Appl. Phys. 1994, 76, 8117-8120.
37. Overney, R. M.; Takano, H.; Fujihira, M. Phys. Rev. Lett. 1994, 72, 3546-3549.
38. Sheehan, P. E.; Lieber, C. M. Science 1996, 272, 1158-1161.
39. Liley, M.; Gourdon, D.; Stamou, D.; Meseth, U.; Fischer, T. M.; Lautz, C.; Stahlberg, H.; Vogel, H.; Burnham, N. A.; Duschl, C. Science 1998, 280, 273-275.
40. Stantesson, L.; Wong, T. M. H.; Taborelli, M.; Descouts, P.; Liley, M.; Duschl, C.; Vogel, H. J. Phys. Chem. 1995, 99, 1038-1045.
41. Persson, B. N. Phys. Rev. B 1994, 50, 4771-4786.