Quantitative topography measurements of rolled aluminium surfaces by atomic force microscopy and optical methods

Surface and Coatings Technology

Volumn 111, Issue 2-3, 1999, Pages 276-286

  Lindseth, I ^a   Bardal, A ^b  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SINTEF   (Norway)

Author keywords

Aluminium; Atomic force microscopy; Interferometry; Laser scanning microscopy; Roughness

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; INTERFEROMETRY; LIGHT REFLECTION; MICROSCOPIC EXAMINATION; SURFACE ROUGHNESS; SURFACE MEASUREMENT;

LASER SCANNING MICROSCOPY;

PROTECTIVE COATINGS; ALUMINUM;

TOPOGRAPHY;

CONFOCAL LASER SCANNING MICROSCOPY; LASER SCANNING MICROSCOPY; WHITE-LIGHT INTERFEROMETRY;

EID: 0032627113     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00828-7     Document Type: Article

References (20)