Optimization of transistor structure for transistor-stabilized field emitter arrays

IEEE Transactions on Electron Devices

Volumn 46, Issue 11, 1999, Pages 2261-2264

  Matsukawa, Takashi ^a,b   Koga, Keisuke ^a   Kanemaru, Seigo ^b   Tanoue, Hisao ^a,b   Itoh, Junji ^a,b  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b PANASONIC CORPORATION   (Japan)

Author keywords

Electron emission; Field emitter arrays; Impact ionization; Reliability testing; Vacuum microelectronics

Indexed keywords

CARRIER MOBILITY; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; CONTROLLABILITY; ELECTRIC CURRENT CONTROL; ELECTRON EMISSION; INTEGRATED CIRCUIT TESTING; IONIZATION OF SOLIDS; RELIABILITY; SYSTEM STABILITY;

IMPACT IONIZATIONS; TRANSISTOR-STABILIZED FIELD EMITTER ARRAYS;

MOSFET DEVICES;

EID: 0033221828     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.796305     Document Type: Article

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