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Volumn 71, Issue 19, 1999, Pages 4423-4426

Detection of low dose radiation induced DNA damage using temperature differential fluorescence assay

Author keywords

[No Author keywords available]

Indexed keywords

DNA; DOUBLE STRANDED DNA; PLASMID DNA;

EID: 0033214809     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac990537z     Document Type: Article
Times cited : (24)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.