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Volumn 35, Issue 5 PART 1, 1999, Pages 2820-2825

Technology assessment for the implementation of magnetoresistive elements with semiconductor components in magnetic random access memory (MRAM) architectures

Author keywords

Magnetic random access memories; Spin valve, tunnel junction

Indexed keywords

MAGNETORESISTANCE; RANDOM ACCESS STORAGE; SEMICONDUCTOR STORAGE;

EID: 0033184254     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800992     Document Type: Article
Times cited : (57)

References (11)
  • 9
    • 0030110553 scopus 로고    scopus 로고
    • "Design, Simulation, and Realization of Solid State Memory Element Using the Weakly Coupled GMR Effect"
    • 32, 520 (1996).
    • Z.G. Wang, and Y. Nakamura, "Design, Simulation, and Realization of Solid State Memory Element Using the Weakly Coupled GMR Effect" IEEE Trans. Magn. 32, 520 (1996).
    • IEEE Trans. Magn.
    • Wang, Z.G.1    Nakamura, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.