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Volumn 385, Issue 1, 1997, Pages 1-14

Van der Waals epitaxy of the layered semiconductors SnSe2 and SnS2: Morphology and growth modes

Author keywords

Growth modes; Layered chalcogenides; Low energy electron diffraction; Molecular beam epitaxy; Photoelectron spectroscopy; Scanning tunnelling microscopy

Indexed keywords

DIFFUSION IN SOLIDS; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MORPHOLOGY; PHOTOEMISSION; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; SUBSTRATES; THERMAL EFFECTS; THERMODYNAMIC STABILITY;

EID: 0031212074     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00066-6     Document Type: Article
Times cited : (60)

References (27)
  • 2
    • 0342571578 scopus 로고
    • Surface studies of layered materials in relation to energy converting interfaces
    • A. Aruchamy (Ed.), Kluwer Academic Publishers, Dordrecht
    • W. Jaegermann, Surface studies of layered materials in relation to energy converting interfaces, in: A. Aruchamy (Ed.), Photoelectrochemistry and Photovoltaics of Layered Semiconductors, Kluwer Academic Publishers, Dordrecht, 1992.
    • (1992) Photoelectrochemistry and Photovoltaics of Layered Semiconductors
    • Jaegermann, W.1
  • 27
    • 85033120821 scopus 로고    scopus 로고
    • to be published
    • R. Schlaf, to be published.
    • Schlaf, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.