Tight-binding-calculation method and physical origin of reflectance difference spectra

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 6 A, 1999, Pages 3497-3503

  Nakayama, Takashi ^a   Murayama, Misao ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTATIONAL METHODS; CRYSTAL ORIENTATION; ELECTRONIC DENSITY OF STATES; INTERFACES (MATERIALS);

REFLECTANCE DIFFERENCE (RD) SPECTRA; TIGHT BINDING CALCULATION;

SEMICONDUCTOR MATERIALS;

EID: 0032689392     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.3497     Document Type: Article

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