In situ spectroscopic ellipsometry of GaAs(001) surface reconstructions

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 20, 1996, Pages 13542-13546

  Wassermeier, M ^a   Behrend, J ^a   Ploog, K ^a   Zettler, J ^b   Stahrenberg, K ^b   Richter, W ^b  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001731540     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.13542     Document Type: Article

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