Optimum Accelerated Lifetests for the Weibull and Extreme Value Distributions

IEEE Transactions on Reliability

Volumn R-24, Issue 5, 1975, Pages 321-332

  Meeker, William Q ^a   Nelson, Wayne ^b  

^a IOWA STATE UNIVERSITY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE TESTING; CENSORED DATA; WEIBULL DISTRIBUTIONS;

RELIABILITY THEORY; STATISTICAL METHODS;

MATERIALS TESTING;

EID: 0016627613     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1975.5214922     Document Type: Article

References (11)

1. M. Glasser, “Regression analysis with censored data,” Biometrics, Vol. 21, pp. 300-307, June 1965.
2. G. J. Hahn, J. M. Miller, “Time-sharing computer programs for estimating parameters of several normal populations and for regression estimation from censored data,” General Electric Research & Development TIS Report 68-C-366, 1968.*
3. G. J. Hahn, W. B. Nelson, “A review and comparison of methods for regression analysis of censored data,” General Electric Research & Development TIS Report 71-C-196, 1971.* Also published in lEEE Trans, on Reliability, Vol. R-23, pp. 2-10, Apr. 1974.*
4. Nancy R. Mann, “Design of overstress lifetest experiments when failure times have a two-parameter Weibull distribution,” Technometrics, Vol. 14, pp. 437-51, May 1972.
5. W. Q. Meeker, W. B. Nelson, “Confidence limits for the Weibull distribution from censored data,” General Electric Co. Corp. Research & Development TIS Report 74CRD245, 1974.*
6. W. Q. Meeker, W. B. Nelson, “Theory for optimum accelerated life tests for Weibull and extreme value distributions,” General Electric Co. Corp. Research & Development TIS Report 74CRD248, 1974.*
7. W. B. Nelson, “Statistical methods for accelerated life test data-the inverse power law model,” General Electric Co. Corp. Research & Development TIS Report 71-C-011, 1970.* Graphical Methods published in IEEE Trans, on Reliability, Vol. R-21, Feb. 1972, pp. 2-11; correction, Aug. 1972, pp. 195.* Least squares methods published in IEEE Trans, on Reliability, Vol. R-24, June 1975, pp. 103-107.
8. W. B. Nelson, R. W. Hendrickson, “1972 Manual for STATPAC-a general purpose program for data analysis and for fitting statistical models to data,” General Electric Research & Development TIS Report 72-GEN-009, 1972.* A short manual is TIS Report 73CRD046, 1973.*
9. W. B. Nelson, T. J. Kielpinski, “Optimum accelerated life tests for normal and lognormal life distributions,” General Electric Corp. Research and Development TIS Report 72-CRD-215, 1972.”
10. T. J. Kielpinski, W. B. Nelson, “Optimum accelerated life tests for normal and lognormal life distributions,” IEEE Trans. Rel., Vol. R-24, pp. 310-320, Dec. 1975.
11. M. J. D. Powell, “An efficient method for finding the minimum of a function of several variables without calculating derivatives.” The Computer Journal, Vol. 7, pp. 155-62, July 1964. William Q. Meeker//Department of Statistics//Snedecor Hall//Iowa State University//Ames, Iowa 50010 USA Wayne Nelson//37-578, GECR&D//Schenectady, NY 12345 USA