Some Aspects of Accelerated Life Testing by Progressive Stress

IEEE Transactions on Reliability

Volumn R-36, Issue 1, 1987, Pages 150-155

  Yin, Xiang Kang ^a   Sheng, Bao Zhong ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Accelerated life test; Constant stress; Exponential distribution; Maximum likelihood estimation; Progressive stress; Step stress; Weibull distribution

Indexed keywords

STRESSES;

ACCELERATED LIFE TESTING; EXPONENTIAL DISTRIBUTION; LIFE DISTRIBUTION; PROGRESSIVE STRESS; WEIBULL DISTRIBUTION;

RELIABILITY;

EID: 0023331397     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1987.5222320     Document Type: Article

References (7)

1. S.S. Mao, L.L. Wang, Reliability Mathematics, Shanghai, 1984.
2. W.B. Nelson, “Accelerated life testing - step-stress models and data analyses”, IEEE Trans. Reliability, vol. R-29, 1980 Jun, pp. 103–108.
3. R. Miller, W.B. Nelson, “Optimum simple step-stress tests for accelerated life testing”, General Electric Research & Development TIS Report 79CRD26, 1979.
4. N.R. Mann, R.E. Schafer, N.D. Singpurwalla, Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, 1974.
5. W.R. Allen, “Notes on some statistical aspects of analysis of accelerated life tests”, private communication, 68, Magnolia Lane, Princeton, NJ 08540 USA, 1965.
6. W. Yurkowski, R.E. Schafer, J.M. Finkelstein, “Accelerated testing technology”, Rome Air Development Center Technical Report RADC-TR-67–420, Griffiss AFB, NY, 1967.
7. R. Miller, W.B. Nelson, “Optimum simple step-stress plans for accelerated life testing”, IEEE Trans. Reliability, vol. R-32, 1983 Apr, pp. 59–65.