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Volumn 20, Issue 6, 1999, Pages 298-300

MOSFET simulation with quantum effects and nonlocal mobility model

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; COMPUTER SIMULATION; MATHEMATICAL MODELS; QUANTUM ELECTRONICS; SEMICONDUCTOR DOPING;

EID: 0032648591     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.767104     Document Type: Article
Times cited : (11)

References (12)
  • 2
    • 0028396643 scopus 로고
    • A simple model for quantization effects in heavily-doped silicon MOSFET's at inversion conditions
    • M. J. van Dort, P. H. Woerlee, and A. J. Walker, "A simple model for quantization effects in heavily-doped silicon MOSFET's at inversion conditions," Solid State Electron., vol. 37, pp. 411-414, 1994.
    • (1994) Solid State Electron. , vol.37 , pp. 411-414
    • Van Dort, M.J.1    Woerlee, P.H.2    Walker, A.J.3
  • 3
    • 0028756974 scopus 로고
    • Determination of ultra-thin gate oxide thickness for CMOS structures using quantum effects
    • R. Rios and N. D. Arora, "Determination of ultra-thin gate oxide thickness for CMOS structures using quantum effects," in IEDM Tech. Dig., 1994, pp. 613-616.
    • (1994) IEDM Tech. Dig. , pp. 613-616
    • Rios, R.1    Arora, N.D.2
  • 5
    • 0030416118 scopus 로고    scopus 로고
    • Accurate doping profile determination using TED/QM models extensible to sub-quarter micron nMOSFET's
    • P. Vande Voorde, P. B. Griffin, Z. Yu, S.-Y. Oh, and R. W. Dutton, "Accurate doping profile determination using TED/QM models extensible to sub-quarter micron nMOSFET's," in IEDM Tech. Dig., 1996, pp. 811-814.
    • (1996) IEDM Tech. Dig. , pp. 811-814
    • Vande Voorde, P.1    Griffin, P.B.2    Yu, Z.3    Oh, S.-Y.4    Dutton, R.W.5
  • 6
    • 0030396118 scopus 로고    scopus 로고
    • Investigation of quantum effects in highly-doped MOSFET's by means of a self-consistent 2-D model
    • A. Spinelli, A. Benvenuti, and A. Pacelli, "Investigation of quantum effects in highly-doped MOSFET's by means of a self-consistent 2-D model," in IEDM Tech. Dig., 1996, pp. 399-402.
    • (1996) IEDM Tech. Dig. , pp. 399-402
    • Spinelli, A.1    Benvenuti, A.2    Pacelli, A.3
  • 7
    • 0031701877 scopus 로고    scopus 로고
    • A physically-based model of the effective mobility in heavily doped n-MOSFET's
    • Jan.
    • S. Villa, A. L. Lacaita, L. M. Perron, and R. Bez, "A physically-based model of the effective mobility in heavily doped n-MOSFET's," IEEE Trans. Electron Devices, vol. ED-45, pp. 110-115, Jan. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.ED-45 , pp. 110-115
    • Villa, S.1    Lacaita, A.L.2    Perron, L.M.3    Bez, R.4
  • 8
    • 0024105667 scopus 로고
    • A physically-based mobility model for numerical simulation of non planar devices
    • Nov.
    • C. Lombardi, S. Vanzini, A. Saporito, and M. Vanzi, "A physically-based mobility model for numerical simulation of non planar devices," IEEE Trans. Computer-Aided Design, vol. 7, pp. 1164-1170, Nov. 1988.
    • (1988) IEEE Trans. Computer-Aided Design , vol.7 , pp. 1164-1170
    • Lombardi, C.1    Vanzini, S.2    Saporito, A.3    Vanzi, M.4
  • 9
    • 84923867681 scopus 로고
    • Semi-empirical local NMOS mobility model for 2-D device simulation incorporating screened minority impurity scattering
    • S. A. Mujtaba, R. W. Dutton, and D. L. Scharfetter, "Semi-empirical local NMOS mobility model for 2-D device simulation incorporating screened minority impurity scattering," in Proc. NUPAD V, 1994, pp. 3-6.
    • (1994) Proc. NUPAD V , pp. 3-6
    • Mujtaba, S.A.1    Dutton, R.W.2    Scharfetter, D.L.3
  • 11
  • 12
    • 0030410571 scopus 로고    scopus 로고
    • Scattering theory for the short channel MOSFET
    • M. Lundstrom, "Scattering theory for the short channel MOSFET," in IEDM Tech. Dig., 1996, pp. 387-390.
    • (1996) IEDM Tech. Dig. , pp. 387-390
    • Lundstrom, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.