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Volumn 74, Issue 1, 1999, Pages 174-177

Effect of clamping conditions and built-in stresses on the thermopneumatic deflection of SiO2/Si membranes with various geometries

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; MEMBRANES; SILICA; STRESS RELAXATION; THERMOELASTICITY;

EID: 0032633053     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00312-4     Document Type: Article
Times cited : (12)

References (14)
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    • Kleimann P., Semmache B., Le Berre M., Barbier D. Thermal drift of piezoresistive properties of LPCVD polysilicon thin films between room temperature and 200°C. Mater. Sci. Eng. B. 46:1997;43-46.
    • (1997) Mater. Sci. Eng. B , vol.46 , pp. 43-46
    • Kleimann, P.1    Semmache, B.2    Le Berre, M.3    Barbier, D.4
  • 3
    • 0040082883 scopus 로고
    • Stress analysis of elastically anisotropic bilayer structures
    • Huei J.-H., Hsu L. Stress analysis of elastically anisotropic bilayer structures. J.A.P. 69(3):1991;1384-1388.
    • (1991) J.A.P. , vol.69 , Issue.3 , pp. 1384-1388
    • Huei, J.-H.1    Hsu, L.2
  • 4
    • 0030705286 scopus 로고    scopus 로고
    • The effect of inorganic thin film material processing and properties on stress in silicon piezoresistive pressure sensor
    • Bitko G., McNeil A.C., Monk D.J. The effect of inorganic thin film material processing and properties on stress in silicon piezoresistive pressure sensor. Mater. Res. Soc. Symp. Proc. 444:1997;221-226.
    • (1997) Mater. Res. Soc. Symp. Proc. , vol.444 , pp. 221-226
    • Bitko, G.1    McNeil, A.C.2    Monk, D.J.3
  • 5
    • 0041725766 scopus 로고    scopus 로고
    • Micro-Raman study of thermoelastic stress distribution in oxidized silicon membranes and correlation with finite element modeling
    • Guyot Y., Malhaire C., Le Berre M., Champagnon B., Sibaï A., Bustarret E., Barbier D. Micro-Raman study of thermoelastic stress distribution in oxidized silicon membranes and correlation with finite element modeling. Mater. Sci. Eng. B. 46:1997;24-28.
    • (1997) Mater. Sci. Eng. B , vol.46 , pp. 24-28
    • Guyot, Y.1    Malhaire, C.2    Le Berre, M.3    Champagnon, B.4    Sibaï, A.5    Bustarret, E.6    Barbier, D.7
  • 7
    • 0020151088 scopus 로고
    • Design considerations for silicon circular diaphragm pressure sensors
    • Yasukawa A., Shimada S., Matsuoka Y., Kanda Y. Design considerations for silicon circular diaphragm pressure sensors. J.J.A.P. 21(7):1982;1049-1052.
    • (1982) J.J.A.P. , vol.21 , Issue.7 , pp. 1049-1052
    • Yasukawa, A.1    Shimada, S.2    Matsuoka, Y.3    Kanda, Y.4
  • 8
    • 0024771422 scopus 로고
    • Mechanical property measurements of thin films using load-deflection of composite rectangular membranes
    • Tabata O., Kawahata K., Sugiyama S., Igarashi I. Mechanical property measurements of thin films using load-deflection of composite rectangular membranes. Sensors and Actuators A. 20:1989;135-141.
    • (1989) Sensors and Actuators a , vol.20 , pp. 135-141
    • Tabata, O.1    Kawahata, K.2    Sugiyama, S.3    Igarashi, I.4
  • 9
    • 0000648361 scopus 로고
    • Mise en œuvre de deux méthodes interférométriques pour la caractérisation mécanique des films minces par l'essai de gonflement. Application au cas du silicium monocristallin
    • Bonnotte E., Delobelle P., Bornier L., Trolard B., Tribillon G. Mise en œuvre de deux méthodes interférométriques pour la caractérisation mécanique des films minces par l'essai de gonflement. Application au cas du silicium monocristallin. J. Phys. III France. 5:1995;953-983.
    • (1995) J. Phys. III France , vol.5 , pp. 953-983
    • Bonnotte, E.1    Delobelle, P.2    Bornier, L.3    Trolard, B.4    Tribillon, G.5
  • 10
    • 0002429638 scopus 로고
    • Principles and applications of wafer curvature techniques for stress measurements in thin films
    • Flinn P.A. Principles and applications of wafer curvature techniques for stress measurements in thin films. Mater. Res. Soc. Symp. Proc. 130:1989;41-51.
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    • Flinn, P.A.1
  • 12
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    • Influence of the bonding conditions on the response of capacitive pressure sensors
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.