Thermal treatment of CdTe surfaces for radiation detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 380, Issue 1-2, 1996, Pages 141-144

  Ozaki, T ^a   Iwase, Y ^a   Takamura, H ^a   Ohmori, M ^a  

^a JAPAN ENERGY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRODES; FABRICATION; GOLD; LEAKAGE CURRENTS; RADIATION DETECTORS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING INDIUM; SURFACE TREATMENT;

CADMIUM TELLURIDE; CURRENT STABILITY; DARK CURRENT; GOLD ELECTRODE; INDIUM ELECTRODE;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030264928     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00295-1     Document Type: Article

References (5)

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3. Y. Iwase, R. Ohno and M. Ohmori, Mat. Res. Soc. Symp. Proc. 302 (1993) 223.
4. M.R. Squillante, G. Entine, E. Frederick, L. Cirignano and T. Hazlett, Nucl. Instr. and Meth. A 283 (1989) 323.
5. P.D. Brown, K. Durose, G.J. Russel and J. Woods, J. Cryst. Growth 101 (1990) 211.