-
2
-
-
0030382531
-
-
For general review on SAQDs, see, for example, W. Seifert, N. Carlsson, M. Miller, M.-E. Pistol, L. Samuelson, and L. R. Wallenberg, Prog. Cryst. Growth Charact. Mater. 33, 423 (1996).
-
(1996)
Prog. Cryst. Growth Charact. Mater.
, vol.33
, pp. 423
-
-
Seifert, W.1
Carlsson, N.2
Miller, M.3
Pistol, M.-E.4
Samuelson, L.5
Wallenberg, L.R.6
-
3
-
-
0029304536
-
-
J. M. Gerard, J. B. Genni, J. Lefevore, J. M. Moison, N. Lebouche, and F. Barthe, J. Cryst. Growth 150, 351 (1995).
-
(1995)
J. Cryst. Growth
, vol.150
, pp. 351
-
-
Gerard, J.M.1
Genni, J.B.2
Lefevore, J.3
Moison, J.M.4
Lebouche, N.5
Barthe, F.6
-
5
-
-
0029304474
-
-
Q. Xie, P. Chen, A. Kalburge, T. R. Ramachandran, A. Nayfonov, A. Konkar, and A. Madhukar, J. Cryst. Growth 150, 357 (1995).
-
(1995)
J. Cryst. Growth
, vol.150
, pp. 357
-
-
Xie, Q.1
Chen, P.2
Kalburge, A.3
Ramachandran, T.R.4
Nayfonov, A.5
Konkar, A.6
Madhukar, A.7
-
6
-
-
36449005775
-
-
G. S. Solomon, J. A. Terezza, and J. S. Harris, Jr., Appl. Phys. Lett. 66, 3161 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 3161
-
-
Solomon, G.S.1
Terezza, J.A.2
Harris J.S., Jr.3
-
7
-
-
0029725090
-
-
N. N. Ledentsov, M. Grundmann, N. Kirstaedter, O. Schmidt, R. Heitz, J. Böhrer, D. Bimberg, V. M. Ustinov, V. A. Shchukin, P. S. Kop'ev, Zh. I. Alferov, S. S. Ruvimov, A. O. Kosogov, P. Werner, U. Richter, U. Gösele, and J. Heydenreish, Solid-State Electron. 40, 785 (1996).
-
(1996)
Solid-State Electron.
, vol.40
, pp. 785
-
-
Ledentsov, N.N.1
Grundmann, M.2
Kirstaedter, N.3
Schmidt, O.4
Heitz, R.5
Böhrer, J.6
Bimberg, D.7
Ustinov, V.M.8
Shchukin, V.A.9
Kop'ev, P.S.10
Alferov, Zh.I.11
Ruvimov, S.S.12
Kosogov, A.O.13
Werner, P.14
Richter, U.15
Gösele, U.16
Heydenreish, J.17
-
8
-
-
0030215909
-
-
and references therein
-
Q. Xie, A. Kalburge, P. Chen, and A. Madhukar, IEEE Photonics Technol. Lett. 8, 965 (1996), and references therein.
-
(1996)
IEEE Photonics Technol. Lett.
, vol.8
, pp. 965
-
-
Xie, Q.1
Kalburge, A.2
Chen, P.3
Madhukar, A.4
-
9
-
-
0030188718
-
-
K. Kamath, P. Bhattacharya, T. Sosnowski, T. Norris, and J. Phillips, Electron. Lett. 32, 1374 (1996).
-
(1996)
Electron. Lett.
, vol.32
, pp. 1374
-
-
Kamath, K.1
Bhattacharya, P.2
Sosnowski, T.3
Norris, T.4
Phillips, J.5
-
10
-
-
21944454760
-
-
and references therein
-
D. L. Huffaker, G. Park, Z. Zou, O. B. Shchukin, and D. G. Deppe, Appl. Phys. Lett. 73, 2564 (1998), and references therein.
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2564
-
-
Huffaker, D.L.1
Park, G.2
Zou, Z.3
Shchukin, O.B.4
Deppe, D.G.5
-
11
-
-
0031677714
-
-
A. Madhukar, T. R. Ramachandran, A. Konkar, I. Mukhametzhanov, W. Yu, and P. Chen, Appl. Surf. Sci. 123/124, 266 (1998).
-
(1998)
Appl. Surf. Sci.
, vol.123-124
, pp. 266
-
-
Madhukar, A.1
Ramachandran, T.R.2
Konkar, A.3
Mukhametzhanov, I.4
Yu, W.5
Chen, P.6
-
12
-
-
0001627890
-
-
R. Heitz, T. R. Ramachandran, A. Kalburge, Q. Xie, I. Mukhametzhanov, P. Chen, and A. Madhukar, Phys. Rev. Lett. 78, 4071 (1997).
-
(1997)
Phys. Rev. Lett.
, vol.78
, pp. 4071
-
-
Heitz, R.1
Ramachandran, T.R.2
Kalburge, A.3
Xie, Q.4
Mukhametzhanov, I.5
Chen, P.6
Madhukar, A.7
-
13
-
-
0001033193
-
-
R. H. Schmidt, G. Medeiros-Ribeiro, U. Kunze, G. Abstreiter, M. Hagn, and P. M. Petroff, J. Appl. Phys. 84, 4268 (1998).
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 4268
-
-
Schmidt, R.H.1
Medeiros-Ribeiro, G.2
Kunze, U.3
Abstreiter, G.4
Hagn, M.5
Petroff, P.M.6
-
14
-
-
0032475013
-
-
Z. M. Wang, S. L. Feng, X. P. Yang, Z. D. Lu, Z. Y. Xu, H. Z. Zheng, F. L. Wang, P. D. Han, and X. F. Duan, J. Cryst. Growth 192, 97 (1998).
-
(1998)
J. Cryst. Growth
, vol.192
, pp. 97
-
-
Wang, Z.M.1
Feng, S.L.2
Yang, X.P.3
Lu, Z.D.4
Xu, Z.Y.5
Zheng, H.Z.6
Wang, F.L.7
Han, P.D.8
Duan, X.F.9
-
15
-
-
0001607821
-
-
H. Lee, R. L. Webb, T. J. Johnson, W. Yang, and P. Sercel, Appl. Phys. Lett. 73, 3556 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3556
-
-
Lee, H.1
Webb, R.L.2
Johnson, T.J.3
Yang, W.4
Sercel, P.5
-
16
-
-
0000198357
-
-
R. Leon, Y. Kim, C. Jagadish, M. Gal, J. Zou, and D. J. H. Cockyane, Appl. Phys. Lett. 69, 1888 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1888
-
-
Leon, R.1
Kim, Y.2
Jagadish, C.3
Gal, M.4
Zou, J.5
Cockyane, D.J.H.6
-
17
-
-
0000991038
-
-
Q. W. Mo, T. W. Fan, Q. Gong, J. Wu, Z. G. Wang, and Y. Q. Bai, Appl. Phys. Lett. 73, 3518 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3518
-
-
Mo, Q.W.1
Fan, T.W.2
Gong, Q.3
Wu, J.4
Wang, Z.G.5
Bai, Y.Q.6
-
18
-
-
85034189202
-
-
note
-
The authors are grateful to Dr. Daniel Rich who, upon being told about the work, remarked, "you mean punctuated growth."
-
-
-
-
19
-
-
0041032153
-
-
F. J. Grunthaner, M. Y. Yen, R. Fernandez, T. C. Lee, A. Madhukar, and B. F. Lewis, Appl. Phys. Lett. 46, 983 (1985).
-
(1985)
Appl. Phys. Lett.
, vol.46
, pp. 983
-
-
Grunthaner, F.J.1
Yen, M.Y.2
Fernandez, R.3
Lee, T.C.4
Madhukar, A.5
Lewis, B.F.6
-
20
-
-
5544265104
-
-
Width is determined as full width at half maximum (FWHM) of the QD profile in the AFM scan, following Q. Xie, N. P. Kobayashi, T. R. Ramachandran, A. Kalburge, P. Chen, and A. Madhukar, J. Vac. Sci. Technol. B 14, 2203 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 2203
-
-
Xie, Q.1
Kobayashi, N.P.2
Ramachandran, T.R.3
Kalburge, A.4
Chen, P.5
Madhukar, A.6
-
21
-
-
0032535998
-
-
and references therein
-
G. Medeiros-Ribeiro, A. M. Bratkovski, T. I. Kamins, D. A. A. Ohlberg, and R. S. Williams, Science 279, 353 (1998), and references therein.
-
(1998)
Science
, vol.279
, pp. 353
-
-
Medeiros-Ribeiro, G.1
Bratkovski, A.M.2
Kamins, T.I.3
Ohlberg, D.A.A.4
Williams, R.S.5
-
22
-
-
16444386423
-
-
H. Lee, R. L. Webb, W. Yang, and P. C. Sercel, Appl. Phys. Lett. 72, 812 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 812
-
-
Lee, H.1
Webb, R.L.2
Yang, W.3
Sercel, P.C.4
-
23
-
-
0001454216
-
-
I. Mukhametzhanov, R. Heitz, J. Zeng, P. Chen, and A. Madhukar, Appl. Phys. Lett. 73, 1841 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 1841
-
-
Mukhametzhanov, I.1
Heitz, R.2
Zeng, J.3
Chen, P.4
Madhukar, A.5
-
25
-
-
85034156334
-
-
private communication
-
Q. Xie et al. (private communication).
-
-
-
Xie, Q.1
|