Microwave near-field polarimetry

Applied Physics Letters

Volumn 75, Issue 5, 1999, Pages 603-605

  Lann, A F ^a   Golosovsky, M ^a   Davidov, D ^a   Frenkel, A ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b MSI Engineering Software Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCULAR WAVEGUIDES; ELECTROMAGNETIC WAVE POLARIZATION; ELECTROMAGNETIC WAVE REFLECTION; HALL EFFECT; MATHEMATICAL MODELS; MICROWAVE DEVICES; OPTICAL RESOLVING POWER; RECEIVING ANTENNAS; SEMICONDUCTOR MATERIALS;

HALL MOBILITY;

POLARIMETERS;

EID: 0032614124     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124454     Document Type: Article

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13. Since the slit width in the present experiment is rather wide, there are some artifacts in Fig. 3, such as nonuniform contrast of the silver square in (a) and structure in the edges of the silver square in (b). We believe that with thinner slits these artifacts would be considerably removed.
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