A rectangular dielectric waveguide technique for determination of permittivity of materials at Vl-4-band

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 12 PART 1, 1998, Pages 2011-2015

  Abbas, Zulkifly ^a   Pollard, Roger D ^a   Kelsall, Robert W ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Dielectric constant; Dielectric waveguide; Permittivity measurements

Indexed keywords

DIELECTRIC WAVEGUIDES; PERMITTIVITY MEASUREMENT; RECTANGULAR WAVEGUIDES;

RECTANGULAR DIELECTRIC WAVEGUIDE (RDWG) TECHNIQUE;

DIELECTRIC MATERIALS;

EID: 0032298922     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.739275     Document Type: Article

References (15)

1. J. R. Birch, G. J. Simonis, M. N. Afsar, R. N. Clarke, J. M. Dutta, H. M. Frost, X. Gerbaux, A. Hadni, W. F. Hall, R. Heidinger, W. W. Ho, C. R. Jones, F. Köninger, R. L. Moore, H. Matsuo, T. Nakano, W. Richter, K. Sakai, M. R. Stead, U. Stümper, R. S. Vigil, and T. B. Wells, An intercomparison of measurement techniques for the determination of the dielectric properties of solids at near millimeter wavelengths, IEEE Trans. Microwave Theory Tech., vol. 42, pp. 956-965, 1994.
2. Z. Abbas, R. D. Pollard, and R. W. Kelsall, Complex permittivity measurements at Aa-band using rectangular dielectric waveguide technique, IEEE Trans. Instrum. Meas., submitted for publication.
3. J. Musil and F. Zacek, Microwave Measurements of Complex Permittivity by Free Space Methods and Their Applications. Amsterdam, The Netherlands: Elsevier, 1986.
4. Z. Abbas, R. D. Pollard, and R. W. Kelsall, Further extensions to rectangular dielectric waveguide technique for dielectric measurements, in Proc. lEEEInstrum. Meas. Tech. Conf. IMTC'97, vol. 1, Ottawa, Ont., Canada, May 19-21, 1997, pp. 44-46.
5. Determination of the dielectric constant of materials from effective refractive index measurements, IEEE Trans. Instrum. Meas., to be published.
6. Q. H. Liu and W. C. Chew, Analysis of discontinuities in planar dielectric waveguides: An eigenmode propagation method, IEEE Trans. Microwave Theory Tech., vol. 39, pp. 422-430, Mar. 1991.
7. A. M. Nicholson and G. F. Ross, Measurement of the intrinsic properties of materials by time domain techniques, IEEE Trans. Instrum. Meas., vol. IM-19, pp. 377-382, Nov. 1970.
8. W. B. Weir, Automatic measurement of complex dielectric constant and permeability at microwave frequencies, Proc. IEEE, vol. 62, pp. 33-36. Jan. 1974.
9. R. M. Knox and P. P. Toulios, Integrated circuits for millimeter through optical frequency range, in Proc. Submillimeter Waves Symp., New York, Mar. 1970, pp. 497-516.
10. E. A. J. Marcatili, Dielectric rectangular waveguide and directional coupler for integrated optics, Bell Syst. Tech. J., vol. 48, pp. 2071-2102, 1969.
11. G. F. Engen and C. A. Hoer, Thru-reflect-line: An improved technique for calibrating the dual 6-port automatic network analyzer, IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 987-993, Dec. 1979.
12. M. N. Afsar, Dielectric measurement of millimeter-wave materials, IEEE Trans. Microwave Theory Tech., vol. MTT-32, pp. 1598-1609, Dec. 1984.
13. M. N. Afsar and K. J. Button, Millimeter-wave dielectric measuremen of materials, Proc. IEEE, vol. 73, pp. 131-153, Jan. 1985.
14. M. N. Afsar, Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of common polymers, IEEE Trans. Instrum. Meas., vol. IM-36, pp. 530-536, Feb. 1987.
15. T. M. Hirvonen, P. Vainikainen, A. Lozowski, and A. V. Räisänen, Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer, IEEE Trans. Instrum. Meas., vol. IM-45, pp. 780-785, Aug. 1996.