Precision Millimeter-Wave Measurements of Complex Refractive Index, Complex Dielectric Permittivity, and Loss Tangent of Common Polymers

IEEE Transactions on Instrumentation and Measurement

Volumn IM-36, Issue 2, 1987, Pages 530-536

  Afsar, Mohammed Nurul ^a,b  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES - LOSS ANGLE MEASUREMENT; INTERFEROMETRY - MILLIMETER WAVES; MATHEMATICAL TRANSFORMATIONS - FOURIER TRANSFORMS; SPECTROSCOPY - MILLIMETER WAVES;

COMPLEX REFRACTIVE INDEX; DIELECTRIC MEASUREMENTS; ELECTROMAGNETIC REFRACTION; MILLIMETER-WAVE INTERFEROMETRY; MILLIMETER-WAVE SPECTROSCOPY;

POLYMERS;

EID: 84891258104     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1987.6312733     Document Type: Article

References (20)

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