Millimeter-Wave Dielectric Measurement of Materials

Proceedings of the IEEE

Volumn 73, Issue 1, 1985, Pages 131-153

  Afsar, Mohammed Nurul ^a   Button, Kenneth J ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSS INCREASE; DIELECTRIC MEASUREMENT; DIELECTRIC PERMITTIVITY; DISPERSIVE FOURIER TRANSFORM SPECTROSCOPY (DFTS); QUASI-OPTICAL MEASUREMENT;

MATERIALS - DIELECTRIC PROPERTIES; SPECTROSCOPY;

ELECTRIC MEASUREMENTS;

EID: 0021786308     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/PROC.1985.13114     Document Type: Article

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