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1
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84921750516
-
Precise millimeter-wave measure ments of complex refractive index, complex dielectric permittivity and loss tangent of GaAs, Si, Si02, A1203, BeO, Macor and Glass
-
Feb.
-
M. N. Afsar and K. J. Button, “Precise millimeter-wave measure ments of complex refractive index, complex dielectric permittivity and loss tangent of GaAs, Si, Si02, A1203, BeO, Macor and Glass,’ IEEE Trans. Microwave Theory Tech., vol. MTT-31, pp. 217–223 Feb. 1983.
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IEEE Trans. Microwave Theory Tech.
, vol.MTT-31
, pp. 217-223
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-
Afsar, M.N.1
Button, K.J.2
-
2
-
-
84941458716
-
The measurement of power absorption coefficients o liquids and solids by transmission dispersive Fourier transforn spectrometry
-
National Physical Laboratory, U.K., Rep. DES 42 June
-
M. N. Afsar, “The measurement of power absorption coefficients o liquids and solids by transmission dispersive Fourier transforn spectrometry,” National Physical Laboratory, U.K., Rep. DES 42 June 1977.
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(1977)
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Afsar, M.N.1
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3
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0016961032
-
Precise dielectric measurement of low-loss materials at millimeter and submillimeter wavelengths
-
June
-
M. N. Afsar and G. W. Chantry, “Precise dielectric measurement of low-loss materials at millimeter and submillimeter wavelengths, IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 509–511 June 1977.
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(1977)
IEEE Trans. Microwave Theory Tech.
, vol.MTT-25
, pp. 509-511
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Afsar, M.N.1
Chantry, G.W.2
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4
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84941485802
-
The measurement of complex refractive index o liquids and solids by dispersive Fourier transform spectroscopy
-
K. J. Button, Ed. New York: Academic Press
-
M. N. Afsar, “The measurement of complex refractive index o liquids and solids by dispersive Fourier transform spectroscopy,” in Infrared and Millimeter Waves, vol. 12, K. J. Button, Ed. New York: Academic Press, 1984.
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(1984)
Infrared and Millimeter Waves
, vol.12
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-
Afsar, M.N.1
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5
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-
0016409681
-
New techniques for dispersive Fourier transform spectrometry of liquids
-
Jan/Feb.
-
M. N. Afsar, J. B. Hasted, and J. Chamberlain, “New techniques for dispersive Fourier transform spectrometry of liquids,” Infrared Phys., vol. 16, pp. 301–310, Jan/Feb. 1976.
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Infrared Phys.
, vol.16
, pp. 301-310
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-
Afsar, M.N.1
Hasted, J.B.2
Chamberlain, J.3
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6
-
-
0017007824
-
The measurement of the refraction spectrum of a loss liquid in the far infrared region
-
May
-
M. N. Afsar, J. Chamberlain, and J. B. Hasted, “The measurement of the refraction spectrum of a loss liquid in the far infrared region,” Infrared Phys., vol. 16, pp. 587–599, May 1976.
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Infrared Phys.
, vol.16
, pp. 587-599
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-
Afsar, M.N.1
Chamberlain, J.2
Hasted, J.B.3
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7
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-
0019613170
-
Millimeter and submillimeter-wave measurements of complex optical and dielectric parameters of materials: Part I—2.5 mm to 0.66 mm for alumina 995, beryllia fused silica, titanium silicate and glass ceramic
-
Sept.
-
M. N. Afsar and K. J. Button, “Millimeter and submillimeter-wave measurements of complex optical and dielectric parameters of materials: Part I—2.5 mm to 0.66 mm for alumina 995, beryllia fused silica, titanium silicate and glass ceramic,” Int. J. Infrared and Millimeter Waves, vol. 2, 1029–1044, Sept. 1981.
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Int. J. Infrared and Millimeter Waves
, vol.2
, pp. 1029-1044
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Afsar, M.N.1
Button, K.J.2
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8
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84941453574
-
Precision millimeter-wave complex dielectric permittivity measurements of low loss materials: One part in 105 measurement of the refractive index
-
IEEE Cat. 82 CHI737-6. Boulder, CO), June
-
M. N. Afsar, “Precision millimeter-wave complex dielectric permittivity measurements of low loss materials: One part in 105 measurement of the refractive index,” in NBS Conf. Precision Electromagnetic Measurements Dig. (CPEM y82) (Boulder, CO), June 1982. IEEE Cat. 82 CHI737-6.
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(1982)
NBS Conf. Precision Electromagnetic Measurements Dig. (CPEM y82)
-
-
Afsar, M.N.1
-
9
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-
0000752452
-
Measurement of the optical constants of liquid H20 and D20 between 6 and 450 cm-1
-
July
-
M. N. Afsar and J. B. Hasted, “Measurement of the optical constants of liquid H20 and D20 between 6 and 450 cm-1,” J Opt. Soc. Am., vol. 67, pp. 902–904, July 1977.
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(1977)
J Opt. Soc. Am.
, vol.67
, pp. 902-904
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Afsar, M.N.1
Hasted, J.B.2
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10
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0001668284
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The accurate measurement of permittivity by means of an open resonator
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A. L. Cullen and P. K. Yu, “The accurate measurement of permittivity by means of an open resonator,” Proc. Roy. Soc. A., vol. 325. pp. 493–509, 1971.
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Proc. Roy. Soc. A.
, vol.325
, pp. 493-509
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Cullen, A.L.1
Yu, P.K.2
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11
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84935287742
-
Complex source-point theory of the open resonator
-
A. L. Cullen and P. K. Yu, “Complex source-point theory of the open resonator,” Proc. Roy. Soc. A., vol. 366, pp 165–171, 1979.
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Proc. Roy. Soc. A.
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, pp. 165-171
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Cullen, A.L.1
Yu, P.K.2
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12
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0016945818
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Precise dielectric measurements at 35 GHz using an open microwave resonator
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Apr.
-
R. G. Jones, “Precise dielectric measurements at 35 GHz using an open microwave resonator,” Proc. Inst. Elec. Eng., vol. 123, pp. 285–290, Apr. 1976.
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Proc. Inst. Elec. Eng.
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Jones, R.G.1
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13
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0017300995
-
A correction to open-resonator permittivity and loss measurements
-
Jan.
-
R. J. Cook and R. G. Jones, “A correction to open-resonator permittivity and loss measurements,” Electron. Lett., vol. 12, pp 1–2, Jan. 1976.
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Electron. Lett.
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Cook, R.J.1
Jones, R.G.2
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14
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84944993187
-
A high sensitivity fast 60 GHz open resonator system for dielectric measurement
-
9th Int. Conf. on IR & MM Waves, Japan
-
T. Matsui and M. N. Afsar, “A high sensitivity fast 60 GHz open resonator system for dielectric measurement,” Int. J. Infrared and Millimeter Waves, to be published, 1984. Presented at 9th Int. Conf. on IR & MM Waves, Japan, 1984.
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(1984)
Int. J. Infrared and Millimeter Waves, to be published
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Matsui, T.1
Afsar, M.N.2
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15
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0019320413
-
Free space video detection of harmonic content of 100 GHz IMPATT oscillator
-
Oct.
-
J. R. Birch, “Free space video detection of harmonic content of 100 GHz IMPATT oscillator,” Electron Lett., vol. 16, pp. 799–800, Oct. 1980.
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Electron Lett.
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Birch, J.R.1
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16
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84944993188
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Dielectric reference materials for the high frequency region: Measurement at 100, 200 and 300 GHz
-
BCR Contract No. 382/1/4/148/78/2 BCR U.K. Brussels, Aug.
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J. R. Birch, “Dielectric reference materials for the high frequency region: Measurement at 100, 200 and 300 GHz,” Final report of NPL 1 to BCR, BCR Contract No. 382/1/4/148/78/2 BCR U.K. Brussels, Aug. 1981.
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Final report of NPL 1 to BCR
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Birch, J.R.1
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17
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84944979784
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A spot frequency Mach-Zehnder interferometer system for complex refractive index measurements at millimeter and submillimeter wavelength region
-
to be published.
-
M. N. Afsar, “A spot frequency Mach-Zehnder interferometer system for complex refractive index measurements at millimeter and submillimeter wavelength region,” Int. J. Infrared and Millimeter Waves, to be published.
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Int. J. Infrared and Millimeter Waves
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Afsar, M.N.1
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18
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84941450164
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A quasi-optical method for measuring the complex dielectric constant of materials
-
to be published.
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F. I. Shimabukuro, S. Lazar, M. R. Chernick, and H. B. Dyson, “A quasi-optical method for measuring the complex dielectric constant of materials,” IEEE Trans. Microwave Theory Tech., to be published.
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IEEE Trans. Microwave Theory Tech.
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Shimabukuro, F.I.1
Lazar, S.2
Chernick, M.R.3
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19
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0015661955
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Measurement of complex permittivity of liquids at frequencies from 5 to 40 GHz
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Sept.
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R. VanLoon and R. Finsy, “Measurement of complex permittivity of liquids at frequencies from 5 to 40 GHz,” Rev. Sci. Instrum., vol. 44, pp. 1204–1208, Sept. 1973.
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VanLoon, R.1
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20
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0016046121
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Measurement of complex permittivity of liquids at frequencies from 60 to 150 GHz
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Apr.
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R. VanLoon and R. Finsy, “Measurement of complex permittivity of liquids at frequencies from 60 to 150 GHz,” Rev. Sci. Instrum., vol. 45, pp. 523–525, Apr. 1974.
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VanLoon, R.1
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21
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84937354768
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Waveguide reflection, measurement: Effect of a non-ideal shorting plunger
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Guildford, UK: IPC Press, J. Chamberlain and G. W. Chantry, Eds.
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R. Finsy and R. VanLoon, “Waveguide reflection, measurement: Effect of a non-ideal shorting plunger,” in High Frequency Dielectric Measurement, J. Chamberlain and G. W. Chantry, Eds. Guildford, UK: IPC Press, 1972, 42–46.
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High Frequency Dielectric Measurement
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22
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0015587890
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A TEoln cavity resonator method to determine the complex permittivity of low-loss liquids at millimeter wavelengths
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U. Stumper, “A TEoln cavity resonator method to determine the complex permittivity of low-loss liquids at millimeter wavelengths,” Rev. Sci. Instrum., vol. 44, pp. 165–169, Feb. 1973.
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Guildford, UK: IPC Press, J. Chamberlain and G. W. Chantry, Eds.
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U. Stumper, “The measurement of the complex permittivity of low-loss liquids at millimeter wavelengths,” in High Frequency Dielectric Measurement, J. Chamberlain and G. W. Chantry, Eds. Guildford, UK: IPC Press, 1972, pp. 51–55.
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High Frequency Dielectric Measurement
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Stumper, U.1
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24
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0017037999
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Precise determination of very low dielectric losses at frequencies of 9 and 26 GHz
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U. Stumper and K. P. Frentrup, “Precise determination of very low dielectric losses at frequencies of 9 and 26 GHz,” Rev. Sci. Instrum., vol. 47, pp. 1196–1200, 1976.
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Stumper, U.1
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25
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J. Goulon, J. P. Sarteaux, J. Brondeau, and G. Roussy, “Mesures interferometnques precises de la permittivite complexe des liquides dans un large domaine de frequences,” Rev. Phys. Appl., vol. 8, pp. 165–174, 1973.
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Realisation d'un inter-ferometre de Michelson en ondes millimetriques
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Sensitivity and response time improvements in a millimeter-wave spectrometer
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W. F. Kolbe and B. Leskovar, “Sensitivity and response time improvements in a millimeter-wave spectrometer,” Rev. Sci. Instrumwlrs„ vol. 53, pp. 769–775, June 1982.
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M. N. Afsar, “Submillimeter wave measurement on liquid dielectrics,” Proc. IEEE, vol. 67, pp. 1460–1463, Oct. 1979.
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Proc. IEEE
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Assessment of random and systematic errors in microwave and submillimeter dielectric measurements
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June
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M. N. Afsar, J. Chamberlain, G. W. Chantry, R. Finsy, and R. VanLoon, “Assessment of random and systematic errors in microwave and submillimeter dielectric measurements,” Proc. Inst. Elec. Eng., vol. 124, pp. 575–577, June 1977.
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