Measurement of the Intrinsic Properties Of Materials by Time-Domain Techniques

IEEE Transactions on Instrumentation and Measurement

Volumn 19, Issue 4, 1970, Pages 377-382

  Nicolson, A M ^a   Ross, G F ^a  

^a Sperry Rand Reserch Center ^*  (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRICS; IEIMA; RADIO MEASUREMENTS;

EID: 0014882762     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1970.4313932     Document Type: Article

References (4)

1. A. R. von Hippel, Ed., Dielectric Materials and Applications. New York: Wiley, 1961.
2. A. M. Nicolson, “Broad-band microwave transmission characteristics from a single measurement of the transient response,” IEEE Trans. Instrum. Meas., vol. IM-17, pp. 395–402, December 1968.
3. G. D. Bergland, “A guided tour of the fast Fourier transform,” IEEE Spectrum, vol. 6, pp. 41–52, July 1969.
4. A. M. Nicolson, “Wideband system function analyzer employing time to frequency domain translation,” presented at WESCON, San Francisco, Calif., August 1969.