A comparative analysis of the dynamic behavior of BTG/SOI MOSFET's and circuits with distributed body resistance

IEEE Transactions on Electron Devices

Volumn 45, Issue 10, 1998, Pages 2138-2145

  Workman, Glenn O ^a   Possum, Jerry G ^a  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; SILICON ON INSULATOR TECHNOLOGY;

BODY-TIED-GATE (BTG) DEVICES; SOFTWARE PACKAGE SOISPICE;

MOSFET DEVICES;

EID: 0032188543     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.725247     Document Type: Article

References (16)

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