Measurement of the localized electronic structure associated with bismuth segregation to copper grain boundaries

Journal of Physics D: Applied Physics

Volumn 29, Issue 7, 1996, Pages 1730-1739

  Bruley, J ^a   Keast, V J ^a   Williams, D B ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; COPPER; ELECTRON ENERGY LOSS SPECTROSCOPY; EMBRITTLEMENT; GRAIN BOUNDARIES; SEGREGATION (METALLOGRAPHY); X RAY SPECTROSCOPY;

ELECTRON ENERGY LOSS NEAR EDGE STRUCTURE; ELECTRON PROBE; X RAY ABSORPTION NEAR EDGE STRUCTURE;

ELECTRONIC STRUCTURE;

EID: 0030190207     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/7/008     Document Type: Article

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