Electron energy-loss spectroscopy at Cu/Al2O3 and Ti/Al2O3 interfaces

Materials Science Forum

Volumn 207-209, Issue PART 1, 1996, Pages 181-184

  Scheu, C ^a   Dehm, G ^a   Mullejans H ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Bonding; EELS; Electronic Structure; ELNES; Metal Ceramic Interface

Indexed keywords

ALUMINA; BONDING; CHEMICAL BONDS; COPPER; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; METALLIC FILMS; OXIDATION; SINGLE CRYSTALS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY LOSS NEAR EDGE STRUCTURE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SPATIAL DIFFERENCE TECHNIQUE;

INTERFACES (MATERIALS);

EID: 3743097292     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (9)

1. Transmission Electron Energy Loss Spectroscopy in Materials Science, ed. by M. M. Disko, C. C. Ahn and B. Fultz, The Minerals, Metals and Materials, Society, Warrendale, (1992)
2. R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986)
3. G. Dehm, C. Scheu, M. Rühle and R. Raj, iib95, (1995), these proceedings
4. H. Müllejans and J. Bruley, Ultramicroscopy 53, 351-360 (1994)
5. H. Müllejans and J. Bruley, J. of Microscopy (1994), in press
6. C. Scheu, G. Dehm, H. Müllejans, R. Brydson and M. Rühle, Microsc. Microanal. Microstruct. 6, 19-31 (1995)
7. H. Gu, private communication
8. R. D. Leapman, L. A. Grunes and P. L. Fejes, Phys. Rew. B 26, 614-635 (1982)
9. S. D. Berger, J. M. Macaulay and L. M. Brown, Phil. Mag. Lett. 56, 179-185(1987)