Integrated RF and microwave components in BiCMOS technology

IEEE Transactions on Electron Devices

Volumn 43, Issue 9, 1996, Pages 1559-1570

  Burghartz, Joachim N ^a   Soyuer, Mehmet ^a   Jenkins, Keith A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MICROWAVE DEVICES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; RADIO EQUIPMENT; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; VLSI CIRCUITS;

BICMOS TECHNOLOGY; MICROWAVE SYSTEMS; RADIO FREQUENCY SYSTEMS;

CMOS INTEGRATED CIRCUITS;

EID: 0030244074     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.535350     Document Type: Article

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