Temperature dependence of Q in spiral inductors fabricated in a silicon-germanium/BiCMOS technology

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1996, Pages 153-156

  Groves, Rob ^a   Stein, Ken ^a   Harame, Dave ^a   Jadus, Dale ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; NATURAL FREQUENCIES; Q FACTOR MEASUREMENT; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES; THERMAL EFFECTS;

RESISTIVE PARASITIC CURRENTS; SPIRAL ELECTRIC INDUCTORS;

ELECTRIC INDUCTORS;

EID: 0030399723     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)