Viscous energy dissipation at high temperatures in silicon nitride

Acta Materialia

Volumn 46, Issue 13, 1998, Pages 4711-4723

  Roebben, G ^a   Donzel, L ^b   Stemmer, S ^a   Steen, M ^c   Schaller, R ^b   Van Der Biest, O ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b EPFL   (Switzerland)

^c JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION TESTING; ENERGY DISSIPATION; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERNAL FRICTION; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINTERING; STRESS ANALYSIS; TENSILE TESTING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LIQUID PHASE SINTERING;

SILICON NITRIDE;

EID: 0032132291     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00131-1     Document Type: Article

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