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Volumn 189-190, Issue , 1998, Pages 291-294

Crystal quality and surface structure of sapphire and buffer layers on sapphire revealed by crystal truncation rod scattering

Author keywords

AlN; GaN; Surface; X ray CTR

Indexed keywords

CRYSTAL GROWTH; NITRIDES; SAPPHIRE; SEMICONDUCTOR GROWTH; SUBSTRATES; SURFACE STRUCTURE;

EID: 0032094524     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00263-2     Document Type: Article
Times cited : (6)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.