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Volumn 400, Issue 1-3, 1998, Pages 109-115
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Nucleation behaviour during silicon UHV-CVD on Si(111)7 × 7
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Author keywords
Chemical vapor deposition; Energy dissipation; Growth; Nucleation; Scanning tunneling microscopy; Silicon
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
ENERGY DISSIPATION;
HYDROGEN;
MOLECULAR BEAM EPITAXY;
NUCLEATION;
SCANNING TUNNELING MICROSCOPY;
SILANES;
THERMAL EFFECTS;
VACUUM APPLICATIONS;
ULTRAHIGH VACUUM;
SILICON;
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EID: 0032028514
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(97)00847-9 Document Type: Article |
Times cited : (7)
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References (18)
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