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Volumn 400, Issue 1-3, 1998, Pages 109-115

Nucleation behaviour during silicon UHV-CVD on Si(111)7 × 7

Author keywords

Chemical vapor deposition; Energy dissipation; Growth; Nucleation; Scanning tunneling microscopy; Silicon

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ENERGY DISSIPATION; HYDROGEN; MOLECULAR BEAM EPITAXY; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SILANES; THERMAL EFFECTS; VACUUM APPLICATIONS;

EID: 0032028514     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00847-9     Document Type: Article
Times cited : (7)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.