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Volumn 10, Issue 1, 1998, Pages 1-43

Aspects of reflectance anisotropy spectroscopy from semiconductor surfaces

Author keywords

[No Author keywords available]

Indexed keywords

CHEMISTRY; CRYSTAL STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON REFLECTION; ELECTRONIC PROPERTIES; IMAGE RECONSTRUCTION; ION BEAMS; OSCILLATIONS; SEMICONDUCTING GALLIUM ARSENIDE; SURFACES; VACUUM APPLICATIONS;

EID: 0031653726     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/10/1/005     Document Type: Article
Times cited : (54)

References (78)
  • 5
    • 11544313536 scopus 로고
    • PhD Thesis University of Wales
    • Morris S J 1994 PhD Thesis University of Wales
    • (1994)
    • Morris, S.J.1
  • 62
    • 11544306209 scopus 로고    scopus 로고
    • private communication
    • Zhang J 1996 private communication
    • (1996)
    • Zhang, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.