메뉴 건너뛰기




Volumn 14, Issue 4, 1996, Pages 3065-3069

Reflectance anisotropy spectroscopy study of GaAs overlayer growth on submonolayer coverages of Si on the GaAs(001)-c(4×4) surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 24644501792     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (20)
  • 16
    • 24644472138 scopus 로고    scopus 로고
    • The RAS intensities are a factor of 3.7 lower in this paper than in our previous publications (Refs. 7 and 8) since the correction factor with which the ac/dc signal ratio is multiplied is now set to the theoretical value that comes out of Aspnes et al.'s (Ref. 15) calculation of the signal shape
    • The RAS intensities are a factor of 3.7 lower in this paper than in our previous publications (Refs. 7 and 8) since the correction factor with which the ac/dc signal ratio is multiplied is now set to the theoretical value that comes out of Aspnes et al.'s (Ref. 15) calculation of the signal shape.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.