Understanding single event phenomena in complex analog and digital integrated circuits

IEEE Transactions on Nuclear Science

Volumn 37, Issue 6, 1990, Pages 1832-1838

  Turflinger, Thomas L ^a   Davey, Martin V ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES, SYMBOLIC--ERROR CORRECTION; DATA CONVERSION, ANALOG TO DIGITAL;

ANALOG INTEGRATED CIRCUITS; SINGLE EVENT PHENOMENA;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0025664565     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101197     Document Type: Article

References (6)

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3. D.M. Newberry, private communication.
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5. E.L. Petersen, J.B. Langworthy, and S.E. Diehl, “Suggested Single Event Upset Figure of Merit,” IEEE Trans. Nucl. Sci, Vol NS-30, p4533, (1983).
6. T. Turflinger, and M.V. Davey, “Transient Radiation Test Techniques for High-Speed Analog-to-Digital Converters,” IEEE Trans. Nucl. Sci., Vol NS-36, p2356, (1989).