Numerical modelling of mechanisms involved in latchup triggering by a laser beam

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1995, Pages 379-386

  Fouillat, P ^a   Lapuyade, H ^a   Touboul, A ^a   Dom, J P ^a   Gaillard, R ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CONTINUOUS WAVE LASERS; INDUCED CURRENTS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; PULSED LASER APPLICATIONS; SEMICONDUCTOR JUNCTIONS; SENSITIVITY ANALYSIS; SUBSTRATES;

PHOTOINDUCED CURRENT; TRIGGER LATCHUP PARASITIC STRUCTURES;

LASER BEAMS;

EID: 0029455073     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)