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Volumn 3133, Issue , 1997, Pages 183-193

Properties of SiO2 and Al2O3 films for use in UV-optical coatings

Author keywords

Laser damage; Microstructure; Optical coatings; Optical properties; UV irradiation

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFLECTION (STRUCTURES); EXCIMER LASERS; INFRARED SPECTROSCOPY; ION BEAM ASSISTED DEPOSITION; LASER BEAM EFFECTS; LASER DAMAGE; LIGHT SCATTERING; MICROSTRUCTURE; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; SPECTROPHOTOMETRY; STRESS ANALYSIS; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; ULTRAVIOLET RADIATION;

EID: 0031289010     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.290192     Document Type: Conference Paper
Times cited : (9)

References (19)
  • 5
    • 34248656777 scopus 로고    scopus 로고
    • Non-contact testing of optical surfaces by multiple-wavelength light scattering measurement
    • to be published
    • (1997) Proc. SPIE , vol.3110
    • Duparré, A.1    Gliech, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.