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Volumn 14, Issue 4, 1997, Pages 69-77

Testing core-based systems: A symbolic methodology

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN FUNCTIONS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; DECISION TABLES; ERROR DETECTION; FINITE AUTOMATA; INTELLECTUAL PROPERTY; INTERCONNECTION NETWORKS; MATHEMATICAL MODELS; RELIABILITY; SYSTEMS ANALYSIS; VLSI CIRCUITS;

EID: 0031251030     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.632883     Document Type: Article
Times cited : (6)

References (10)
  • 1
    • 0030685592 scopus 로고    scopus 로고
    • Testing Embedded Cores Using Partial Isolation Rings
    • IEEE Computer Society Press, Los Alamitos, Calif.
    • N.A. Touba and E.J. McCluskey, "Testing Embedded Cores Using Partial Isolation Rings," Proc. IEEE VLSI Test Symp., IEEE Computer Society Press, Los Alamitos, Calif., 1997, pp. 10-16.
    • (1997) Proc. IEEE VLSI Test Symp. , pp. 10-16
    • Touba, N.A.1    McCluskey, E.J.2
  • 2
    • 0030402724 scopus 로고    scopus 로고
    • A Unified Methodology for Intellectual Property and Custom Logic Testing
    • IEEE CS Press
    • S. Bhatia, T. Gheewala, and P. Varma, "A Unified Methodology for Intellectual Property and Custom Logic Testing," Proc. Int'l Test Conf., IEEE CS Press, 1996, pp. 639-648.
    • (1996) Proc. Int'l Test Conf. , pp. 639-648
    • Bhatia, S.1    Gheewala, T.2    Varma, P.3
  • 3
    • 0022769976 scopus 로고
    • Graph-Based Algorithms for Boolean Function Manipulation
    • Aug.
    • R. Bryant "Graph-Based Algorithms for Boolean Function Manipulation," IEEE Trans. Computers, Vol. C-35, No. 8, Aug. 1986, pp. 79-85.
    • (1986) IEEE Trans. Computers , vol.C-35 , Issue.8 , pp. 79-85
    • Bryant, R.1
  • 4
    • 0029747885 scopus 로고    scopus 로고
    • BDD-Based Testability Estimation of VHDL Designs
    • IEEE CS Press
    • F. Ferrandi et al., "BDD-Based Testability Estimation of VHDL Designs," Proc. IEEE European VHDL Conf., IEEE CS Press, 1996, pp. 444-449.
    • (1996) Proc. IEEE European VHDL Conf. , pp. 444-449
    • Ferrandi, F.1
  • 5
    • 0030193155 scopus 로고    scopus 로고
    • Functional Test Generation for Synchronous Sequential Circuits
    • July
    • M.K. Srinivas, J. Jacob, and V.D. Agrawal, "Functional Test Generation for Synchronous Sequential Circuits," IEEE Trans. Computer-Aided Design, Vol. 15, No. 7, July 1996, pp. 831-843.
    • (1996) IEEE Trans. Computer-Aided Design , vol.15 , Issue.7 , pp. 831-843
    • Srinivas, M.K.1    Jacob, J.2    Agrawal, V.D.3
  • 6
  • 7
    • 0029717167 scopus 로고    scopus 로고
    • Test Generation for Networks of Interacting FSMs Using Symbolic Techniques
    • IEEE CS Press
    • F. Ferrandi et al., "Test Generation for Networks of Interacting FSMs Using Symbolic Techniques," Proc. IEEE Sixth Great Lakes Symp. VLSI, IEEE CS Press, 1996, pp. 208-213.
    • (1996) Proc. IEEE Sixth Great Lakes Symp. VLSI , pp. 208-213
    • Ferrandi, F.1
  • 8
    • 0026174927 scopus 로고
    • On Removing Redundancy in Sequential Circuits
    • IEEE CS Press
    • K.T. Cheng, "On Removing Redundancy in Sequential Circuits," Proc. ACM/IEEE Design Automation Conf., IEEE CS Press, 1991, pp. 164-169.
    • (1991) Proc. ACM/IEEE Design Automation Conf. , pp. 164-169
    • Cheng, K.T.1
  • 9
    • 0025263555 scopus 로고
    • Irredundant Sequential Machines via Optimal Logic Synthesis
    • Jan.
    • S. Devadas et al., "Irredundant Sequential Machines via Optimal Logic Synthesis," IEEE Trans. Computer Aided Design, Vol. 9, No. 1, Jan. 1990, pp. 8-17.
    • (1990) IEEE Trans. Computer Aided Design , vol.9 , Issue.1 , pp. 8-17
    • Devadas, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.