Unifying methodology for intellectual property and custom logic testing

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 639-648

  Bhatia, Sandeep ^a   Gheewala, Tushar ^a   Varma, Prab ^a  

^a CrossCheck Technology Inc

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DATA STORAGE EQUIPMENT; INTELLECTUAL PROPERTY; LOGIC DESIGN; PARALLEL PROCESSING SYSTEMS; VECTORS;

CUSTOM LOGIC TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0030402724     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)