Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 5, 1997, Pages 1120-1127

  Heuermann, Holger ^a   Schiek, Burkhard ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Calibration; De embedding; Leaky errors; On wafer measurements; Scattering parameter measurements

Indexed keywords

CALIBRATION; ERROR CORRECTION; MATHEMATICAL MODELS;

ON WAFER MEASUREMENTS;

ELECTRIC NETWORK ANALYZERS;

EID: 0031247095     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.676724     Document Type: Article

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